• 633 Citations
  • 14 h-Index
19972019

Research output per year

If you made any changes in Pure these will be visible here soon.

Research Output

Filter
Conference contribution
2003

NBTI mechanism explored on the back gate bias for pMOSFETs

Chen, M. G., Li, J. S., Jiang, C., Liu, C. H., Su, K. C. & Chang, Y. H., 2003 Jan 1, 2003 IEEE International Integrated Reliability Workshop Final Report, IRW 2003. Institute of Electrical and Electronics Engineers Inc., p. 131-132 2 p. 1283319. (IEEE International Integrated Reliability Workshop Final Report; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)
2002

Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N2O-grown oxides and NO RTA treatment

Liu, C. H., Lin, H. S., Lin, Y. Y., Chen, M. G., Pan, T. M., Kao, C. J., Huang, K. T., Lin, S. H., Sheng, Y. C., Chang, W. T., Lee, J. H., Huang, M., Hsiung, C. S., Huang-Lu, S., Hsu, C. C., Liang, A. Y., Chen, J., Hsieh, W. Y., Yen, P. W., Chien, S. C. & 3 others, Loh, Y. T., Chang, Y. J. & Liou, F. T., 2002 Jan 1, 2002 IEEE International Reliability Physics Symposium Proceedings, IRPS 2002 - 40th Annual. Institute of Electrical and Electronics Engineers Inc., p. 268-271 4 p. 996646. (IEEE International Reliability Physics Symposium Proceedings; vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
1998

New mechanism for gate oxide degradation and its applications

Liu, C. H., Fu, K. Y., DeMassa, T. A. & Sanchez, J. J., 1998, International Integrated Reliability Workshop Final Report. IEEE, p. 68-71 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution