• 575 Citations
  • 13 h-Index
19972019

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2019

Bi-directional Sub-60mV/dec, Hysteresis-Free, Reducing Onset Voltage and High Speed Response of Ferroelectric-AntiFerroelectric Hf0.25Zr0.75O2 Negative Capacitance FETs

Lee, M. H., Lin, Y. Y., Yang, Y. J., Hsieh, F. C., Chang, S. T., Liao, M. H., Li, K. S., Liu, C. W., Chen, K. T., Liao, C. Y., Siang, G. Y., Lo, C., Chen, H. Y., Tseng, Y. J., Chueh, C. Y. & Chang, C., 2019 Dec, 2019 IEEE International Electron Devices Meeting, IEDM 2019. Institute of Electrical and Electronics Engineers Inc., 8993581. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2019-December).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Embedded PUF on 14nm HKMG FinFET Platform: A Novel 2-bit-per-cell OTP-based Memory Feasible for IoT Secuirty Solution in 5G Era

Hsieh, E. R., Wang, H. W., Liu, C. H., Chung, S. S., Chen, T. P., Huang, S. A., Chen, T. J. & Cheng, O., 2019 Jun, 2019 Symposium on VLSI Technology, VLSI Technology 2019 - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., p. T118-T119 8776515. (Digest of Technical Papers - Symposium on VLSI Technology; vol. 2019-June).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The guideline on designing a high performance nc mosfet by matching the gate capacitance and mobility enhancement

Luo, Y. C., Li, F. L., Hsieh, E. R., Liu, C. H., Chung, S. S., Chen, T. P., Huang, S. A., Chen, T. J. & Chenz, O., 2019 Apr, 2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019. Institute of Electrical and Electronics Engineers Inc., 8804688. (2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The understanding of gate capacitance matching on achieving a high performance NC MOSFET with sufficient mobility

Chiang, C. K., Husan, P., Lou, Y. C., Li, F. L., Hsieh, E. R., Liu, C. H. & Chung, S. S., 2019 Jun, 2019 Silicon Nanoelectronics Workshop, SNW 2019. Institute of Electrical and Electronics Engineers Inc., 8782951. (2019 Silicon Nanoelectronics Workshop, SNW 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2018

A novel rewritable one-time-programming OTP (RW-OTP) realized by dielectric-fuse RRAM devices featuring ultra-high reliable retention and good endurance for embedded applications

Cheng, H. W., Hsieh, E. R., Huang, Z. H., Chuang, C. H., Chen, C. H., Li, F. L., Lo, Y. M., Liu, C. H. & Chung, S. S., 2018 Jul 3, 2018 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2018. Institute of Electrical and Electronics Engineers Inc., p. 1-2 2 p. (2018 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2017

A novel design of P-N staggered face-tunneling TFET targeting for low power and appropriate performance applications

Hsieh, E. R., Fan, Y. C., Chang, K. Y., Liu, C. H., Chien, C. H. & Chung, S. S., 2017 Jun 7, 2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017. Institute of Electrical and Electronics Engineers Inc., 7942487. (2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Exploring the spatial concepts and abilities of indigenous Atayal elementary school students in Taiwan

Chao, J. Y., Liu, C. H. & Yao, L. Y., 2017 Feb 2, Proceedings of the IEEE International Conference on Advanced Materials for Science and Engineering: Innovation, Science and Engineering, IEEE-ICAMSE 2016. Meen, T-H., Prior, S. D. & Lam, A. D. K-T. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 65-67 3 p. 7840233. (Proceedings of the IEEE International Conference on Advanced Materials for Science and Engineering: Innovation, Science and Engineering, IEEE-ICAMSE 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

First demonstration of flash RRAM on pure CMOS logic 14nm FinFET platform featuring excellent immunity to sneak-path and MLC capability

Hsieh, E. R., Kuo, Y. C., Cheng, C. H., Kuo, J. L., Jiang, M. R., Lin, J. L., Cheng, H. W., Chung, S. S., Liu, C. H., Chen, T. P., Yeah, Y. H., Chen, T. J. & Cheng, O., 2017 Jul 31, 2017 Symposium on VLSI Technology, VLSI Technology 2017. Institute of Electrical and Electronics Engineers Inc., p. T72-T73 7998204. (Digest of Technical Papers - Symposium on VLSI Technology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Geometric variation: A novel approach to examine the surface roughness and the line roughness effects in trigate FinFETs

Hsieh, E. R., Fan, Y. C., Liu, C. H., Chung, S. S., Huang, R. M., Tsai, C. T. & Yew, T. R., 2017 Jun 13, 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 130-131 2 p. 7947549. (2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kinect augmented reality gear game design

Chen, J. Y., Liu, C. H., Hsieh, C. H., Huang, S. Y., Wang, W. K. & Nien, B. H., 2017 Jul 21, Proceedings of the 2017 IEEE International Conference on Applied System Innovation: Applied System Innovation for Modern Technology, ICASI 2017. Meen, T-H., Lam, A. D. K-T. & Prior, S. D. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 373-375 3 p. 7988429. (Proceedings of the 2017 IEEE International Conference on Applied System Innovation: Applied System Innovation for Modern Technology, ICASI 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2016

Study on CPS spatial concept course and assessments for aboriginal children: With “rotation” and “mapping” as examples

Chao, J. Y., Yao, L. Y., Liu, C. H. & Chen, J. Y., 2016 Jan 1, Applied System Innovation - Proceedings of the International Conference on Applied System Innovation, ICASI 2015. Lam, A. D. K-T., Prior, S. D. & Meen, T-H. (eds.). CRC Press/Balkema, p. 735-740 6 p. (Applied System Innovation - Proceedings of the International Conference on Applied System Innovation, ICASI 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2015

Design of complementary tilt-gate TFETs with SiGe/Si and III-V integrations feasible for ultra-low-power applications

Hsieh, E. R., Lin, Y. S., Zhao, Y. B., Liu, C. H., Chien, C. H. & Chung, S. S., 2015 Sep 24, 2015 Silicon Nanoelectronics Workshop, SNW 2015. Institute of Electrical and Electronics Engineers Inc., 7275322. (2015 Silicon Nanoelectronics Workshop, SNW 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2014

Augmented Reality in design and implementation of interactive recycling game

Chen, J. Y., Liu, C. H. & Wang, W. K., 2014 Mar 10, Environment, Energy and Sustainable Development - Proceedings of the 2013 International Conference on Frontier of Energy and Environment Engineering, ICFEEE 2013. p. 805-808 4 p. (Environment, Energy and Sustainable Development - Proceedings of the 2013 International Conference on Frontier of Energy and Environment Engineering, ICFEEE 2013; vol. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Effect of nitridation of hafnium silicate gate dielectric on positive bias temperature instability in pMOS devices

Samanta, P., Huang, H. S., Chen, S. Y. & Liu, C. H., 2014 Mar 13, 2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014. Institute of Electrical and Electronics Engineers Inc., 7061072. (2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Physically based modeling for stress assessment in MOS devices

Lee, C. C., Lin, K. C., Lin, Y. H., Lai, Y. C. & Liu, C-H., 2014 Mar 13, 2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014. Institute of Electrical and Electronics Engineers Inc., 7061231

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The analysis of channel stress induced by CESL in N-MOSFET

Twu, M-J., Kao, W-C., Lin, K. C., Chen, K. D., Kua, Y. T. & Liu, C-H., 2014 Jan 16, Quantum, Nano, Micro Technologies and Applied Researches. p. 235-240 6 p. (Applied Mechanics and Materials; vol. 481).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The experimental demonstration of the BTI-induced breakdown path in 28nm high-k metal gate technology CMOS devices

Hsieh, E. R., Lu, P. Y., Chung, S. S., Chang, K. Y., Liu, C. H., Ke, J. C., Yang, C. W. & Tsai, C. T., 2014 Sep 8, Digest of Technical Papers - Symposium on VLSI Technology. Institute of Electrical and Electronics Engineers Inc., 6894389. (Digest of Technical Papers - Symposium on VLSI Technology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

The observation of BTI-induced RTN traps in inversion and accumulation modes on HfO 2 high-k metal gate 28nm CMOS devices

Wu, P. C., Hsieh, E. R., Lu, P. Y., Chung, S. S., Chang, K. Y., Liu, C-H., Ke, J. C., Yang, C. W. & Tsai, C. T., 2014 Jan 1, Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2014. IEEE Computer Society, 6839679. (Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2014).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
2013

Impact of stress induced by stressors on hot carrier reliability of strained nMOSFETs

Hsu, H. W., Huang, H. S., Chen, S. Y., Wang, M. C., Li, K. C., Lin, K. C. & Liu, C-H., 2013 Mar 13, Proceedings of the 2013 IEEE 5th International Nanoelectronics Conference, INEC 2013. p. 89-90 2 p. 6465962. (Proceedings - Winter Simulation Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Probing moving charge distribution of biaxial and CESL strained PMOSFETs with body effect

Wang, M. C., Jhang, J. Z., Wang, S. J., Yang, H. C., Liao, W. S., Lu, M. F., Wu, G. W. & Liu, C. H., 2013 May 27, ISNE 2013 - IEEE International Symposium on Next-Generation Electronics 2013. p. 375-378 4 p. 6512371

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Si-capping thicknesses impacting compressive strained MOSFETs with temperature effect

Wang, M. C., Peng, S. H., Wang, S. J., Yang, H. C., Liao, W. S., Li, C. W. & Liu, C. H., 2013 May 27, ISNE 2013 - IEEE International Symposium on Next-Generation Electronics 2013. p. 361-364 4 p. 6512367

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The analysis of the process-induced channel stress in N-MOSFET

Twu, M-J., Deng, R. H., Chen, Z. H., Tsai, M. C., Lin, K. C. & Liu, C-H., 2013 Jul 8, Materials Science and Chemical Engineering. p. 440-444 5 p. (Advanced Materials Research; vol. 699).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The effect of ternary material (Zr, Y, and O) high-k gate dielectrics

Lin, K. C., Chou, C. H., Chen, J. Y., Li, C. J., Huang, J. Y. & Liu, C-H., 2013 Jul 8, Materials Science and Chemical Engineering. p. 422-425 4 p. (Advanced Materials Research; vol. 699).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

The enhancement of MOSFET electric performance through strain engineering by refilled sige as Source and Drain

Yang, H. C., Li, C. W., Liao, W. S., Du, C. K., Wang, M. C., Yang, J. M., Lian, C. W. & Liu, C-H., 2013 Mar 13, Proceedings of the 2013 IEEE 5th International Nanoelectronics Conference, INEC 2013. p. 251-253 3 p. 6466014. (Proceedings - Winter Simulation Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

The simulation analysis of MOSFET channel stress for different oxide/nitride/oxide (ONO) spacer thicknesses

Chen, J. Y., Chen, Z. H., Lin, K. C., Twu, M-J., Hung, Y. H., Chou, P. Y., Chen, G. T., Liu, Y. S. & Liu, C-H., 2013 Jul 8, Materials Science and Chemical Engineering. p. 436-439 4 p. (Advanced Materials Research; vol. 699).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2012

A study of characteristics of halogen-free prevented solder materials

Wang, M. C., Shih, T. T., Lin, B. Y., Yang, H. C., Wu, Y. D. & Liu, C-H., 2012 Dec 1, ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging. p. 101-104 4 p. 6474579. (ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2011

Adaptive fuzzy control of two-wheeled balancing vehicle

Chen, J. Y., Liu, C. H., Chen, C. C. & Lin, K. C., 2011 Dec 1, Proceedings - 2011 International Conference on Instrumentation, Measurement, Computer, Communication and Control, IMCCC 2011. p. 341-344 4 p. 6154070. (Proceedings - 2011 International Conference on Instrumentation, Measurement, Computer, Communication and Control, IMCCC 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Current conduction mechanisms of 0.65 nm equivalent oxide thickness HfZrLaO thin films

Chen, H. W., Hsu, H. W., Chen, S. Y., Huang, H. S., Wang, M. C. & Liu, C. H., 2011 Sep 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991686. (Proceedings - International NanoElectronics Conference, INEC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

SOP package surface discoloration after PCT test

Wang, M. C., Yang, H. C., Liu, C-H. & Yang, R. H., 2011 Nov 22, ICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging. p. 855-858 4 p. 6066964

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

The influence of physical and electrical properties in HfO2 thin film with different lanthanum doping position

Juan, P. C., Chien, Y. S., Lin, J. Y., Cheng, C. P., Liu, C. H., Hsu, H. W., Chen, H. W. & Huang, H. S., 2011 Sep 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991692. (Proceedings - International NanoElectronics Conference, INEC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The study of integrating PDA mobile learning device into the Arts and Humanities Learning Curriculum for elementary schools-mobile digital learning space

Chao, J., Lu, Y. H., Tzeng, Y. D. & Liu, C. H., 2011 Sep 23, 2011 International Conference on Multimedia Technology, ICMT 2011. p. 6119-6124 6 p. 6001904

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Time dependent dielectric breakdown (TDDB) characteristics of metal-oxide-semiconductor capacitors with HfLaO and HfZrLaO ultra-thin gate dielectrics

Liu, C-H., Chen, Y. L., Cheng, C-P., Chen, H. W., Hsu, H. W., Chen, S. Y., Huang, H. S. & Wang, M. C., 2011 Sep 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991693. (Proceedings - International NanoElectronics Conference, INEC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2010

Ameliorated particle swarm optimization by integrating Taguchi methods

Liu, C-H., Chen, Y. L. & Chen, J. Y., 2010 Nov 15, 2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010. p. 1823-1828 6 p. 5580960. (2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010; vol. 4).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

An adaptive PID controller

Chen, J. Y., Liu, C. H., Fan, C. W., Shin, H. Y. & Yen, M. H., 2010 Nov 15, 2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010. p. 884-889 6 p. 5580596. (2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010; vol. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

A study to performance of electroplating solder bump in assembly

Wang, M. C., Huang, K. S., Hsieh, Z. Y., Yang, H. C., Liu, C-H. & Lin, C. R., 2010 Nov 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 794-797 4 p. 5582692. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Depth profiles and chemical bonding states of graded doping and ultra-thin HfLaO high-k dielectrics deposited on silicon substrate

Juan, P. C., Liu, C-H., Jou, M., Chen, Y. K., Liu, Y. W., Hsu, C. W., Chou, Y. H. & Lin, J. Y., 2010 May 5, INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. p. 672-673 2 p. 5424647. (INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Efficiency improvement of organic light emitting diodes with co-deposited hole blocking layer

Liu, C. H., Tseng, C. H. & Cheng, C. P., 2010 Jan 1, Diffusion in Solids and Liquids V. Trans Tech Publications Ltd, Vol. 297-301. p. 561-566 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Efficiency of dispenser with nozzle technology in assembly

Wang, M. C., Huang, K. S., Chen, S. Y., Hsieh, Z. Y., Yang, H. C., Liu, C-H. & Lin, C. R., 2010 Nov 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 476-479 4 p. 5583781. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Influences of dye doping and hole blocking layer insertion on OLED performance

Tesng, C. H., Liu, C. H. & Cheng, C. P., 2010 Jan 1, Diffusion in Solids and Liquids V. Trans Tech Publications Ltd, Vol. 297-301. p. 555-560 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Performance of silver-glue attachment technology in assembly

Wang, M. C., Huang, K. S., Hsieh, Z. Y., Yang, H. C., Liu, C. H. & Lin, C. R., 2010 Nov 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 472-475 4 p. 5583797. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Structural properties of ultra-thin Y2O3 gate dielectrics studied by X-Ray Diffraction (XRD) and X-Ray Photoelectron Spectroscopy (XPS)

Liu, C. H., Juan, P. C., Cheng, C. P., Lai, G. T., Lee, H., Chen, Y. K., Liu, Y. W. & Hsu, C. W., 2010 May 5, INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. p. 1256-1257 2 p. 5424914. (INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
2009

Analysis of promising copper wire bonding in assembly consideration

Wang, M. C., Hsieh, Z. Y., Huang, K. S., Liu, C. H. & Lin, C. R., 2009, IMPACT Conference 2009 International 3D IC Conference - Proceedings. p. 108-111 4 p. 5382168

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Optimization of solderability for 2.4GHz RF printed-circuit-board products

Wang, M. C., Yang, T. Y., Hsieh, Z. Y., Yang, H. C., Liu, C. H. & Lin, C. R., 2009 Dec 1, IMPACT Conference 2009 International 3D IC Conference - Proceedings. p. 227-230 4 p. 5382133

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2008

Electrical and reliability characteristics in strained-Si mOSFETs

Yang, C. C., Pan, T. M., Chen, K. M. & Liu, C-H., 2008 Nov 17, ECS Transactions - Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing. 2 ed. p. 271-277 7 p. (ECS Transactions; vol. 13, no. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot carrier reliability of ald HfSiON gated MOSFETs with different compositions

Chen, H. W., Chen, S. Y., Lu, C. C., Liu, C-H., Chiu, F. C., Hsieh, Z. Y., Huang, H. S., Cheng, L. W., Lin, C. T., Ma, G. H. & Sun, S. W., 2008 Dec 1, ECS Transactions - Physics and Technology of High-k Gate Dielectrics 6. 5 ed. p. 55-66 12 p. (ECS Transactions; vol. 16, no. 5).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Interfacial and electrical characterization of hfo 2 -gated MOSCs and MOSFETs by C-V and gated-diode method

Chen, S. Y., Chen, H. W., Chen, C. H., Chiu, F. C., Liu, C-H., Hsieh, Z. Y., Huang, H. S. & Hwang, H. L., 2008 Dec 1, ECS Transactions - Physics and Technology of High-k Gate Dielectrics 6. 5 ed. p. 131-138 8 p. (ECS Transactions; vol. 16, no. 5).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Interfacial characterization of ceo2-gatcd MOSFETs using gated-diode method and charge pumping technique

Chm, F. C., Chen, H. W., Chen, C. H., Liu, C. H., Chen, S. Y., Huang, B. S., Hsieh, Z. Y., Huang, H. S. & Hwang, H. L., 2008 Dec 1, ECS Transactions - Physics and Technology of High-k Gate Dielectrics 6. 5 ed. p. 423-432 10 p. (ECS Transactions; vol. 16, no. 5).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

National Project on 45 to 32 nm metal oxide semiconductor field effect transistors for next century IC fabrications

Hwang, H. L., Wang, C. W., Chang, K. H., Tsai, C. H., Leou, K. C., Chang-Liao, K. S., Lu, C. C., Chang, S. C., Chiu, F. C., Liu, C. H., Chin, A., Chang, K. M. & Chen, B. N., 2008 Dec 1, 2008 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC. 4760691. (2008 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Robots with object-oriented peripheral modules controlled by a Personal Single Board Computer (PSBC)

Liu, C-H., Hsu, H. W., Chen, J. Y., Chao, J., Pao, H. & Chang, J., 2008 Dec 1, IEEE International Conference on Advanced Robotics and its Social Impacts, ARSO 2008. 4653614. (Proceedings of IEEE Workshop on Advanced Robotics and its Social Impacts, ARSO).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2006

On the design and analysis of the 4th-order leapfrog sigma-delta modulator

Lin, K. C. & Liu, C. H., 2006, 2006 International Conference on Communications, Circuits and Systems, ICCCAS, Proceedings - Circuits and Systems. Vol. 4. p. 2304-2308 5 p. 4064385

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)