• 633 Citations
  • 14 h-Index
19972019

Research output per year

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Research Output

2013

Si-capping thicknesses impacting compressive strained MOSFETs with temperature effect

Wang, M. C., Peng, S. H., Wang, S. J., Yang, H. C., Liao, W. S., Li, C. W. & Liu, C. H., 2013 May 27, ISNE 2013 - IEEE International Symposium on Next-Generation Electronics 2013. p. 361-364 4 p. 6512367

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor under heating and hot-carrier stresses

Wang, M. C., Peng, M. R., Ji, L. R., Huang, H. S., Chen, S. Y., Wang, S. J., Hsu, H. W., Liao, W. S. & Liu, C-H., 2013 May 27, p. 371-374. 4 p.

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Temperature-dependent current conduction of metal-ferroelectric (BiFeO 3)-insulator (ZrO2)-Silicon capacitors for nonvolatile memory applications

Juan, P. C., Lin, C. L., Liu, C. H., Chen, C. H., Chang, Y. K. & Yeh, L. Y., 2013 Jul 31, In : Thin Solid Films. 539, p. 360-364 5 p.

Research output: Contribution to journalArticle

5 Citations (Scopus)

The analysis of the process-induced channel stress in N-MOSFET

Twu, M-J., Deng, R. H., Chen, Z. H., Tsai, M. C., Lin, K. C. & Liu, C-H., 2013 Jul 8, Materials Science and Chemical Engineering. p. 440-444 5 p. (Advanced Materials Research; vol. 699).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The effect of ternary material (Zr, Y, and O) high-k gate dielectrics

Lin, K. C., Chou, C. H., Chen, J. Y., Li, C. J., Huang, J. Y. & Liu, C-H., 2013 Jul 8, Materials Science and Chemical Engineering. p. 422-425 4 p. (Advanced Materials Research; vol. 699).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

The effect of ZrN antidiffusion capping layer on the electrical and physical properties of metal-gate/ZrN/Zr-graded Dy2O3/Si MIS nanolaminated structures

Juan, P. C., Liu, C. H., Lin, C. L., Mong, F. C. & Huang, J. H., 2013 Apr 30, In : Microelectronic Engineering. 109, p. 172-176 5 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

The enhancement of MOSFET electric performance through strain engineering by refilled sige as Source and Drain

Yang, H. C., Li, C. W., Liao, W. S., Du, C. K., Wang, M. C., Yang, J. M., Lian, C. W. & Liu, C-H., 2013 Mar 13, Proceedings of the 2013 IEEE 5th International Nanoelectronics Conference, INEC 2013. p. 251-253 3 p. 6466014. (Proceedings - Winter Simulation Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

The simulation analysis of MOSFET channel stress for different oxide/nitride/oxide (ONO) spacer thicknesses

Chen, J. Y., Chen, Z. H., Lin, K. C., Twu, M-J., Hung, Y. H., Chou, P. Y., Chen, G. T., Liu, Y. S. & Liu, C-H., 2013 Jul 8, Materials Science and Chemical Engineering. p. 436-439 4 p. (Advanced Materials Research; vol. 699).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Trend of subthreshold swing with DPN process for 28nm N/PMOSFETs

Wang, M. C., Du, C. K., Peng, M. R., Wang, S. J., Chen, S. Y., Liu, C-H., Cheng, O., Huang, L. S. & Lee, S. C., 2013 May 27, p. 389-392. 4 p.

Research output: Contribution to conferencePaper

3 Citations (Scopus)
2012

Adaptive Fuzzy Cerebellar Model Articulation Controller for two-wheeled robot

Chen, J. Y., Lin, K. C., Tsai, P. S., Liu, C-H. & Ouyang, J. M., 2012 Apr 4, In : Advanced Materials Research. 482-484, p. 1025-1036 12 p.

Research output: Contribution to journalConference article

A study of characteristics of halogen-free prevented solder materials

Wang, M. C., Shih, T. T., Lin, B. Y., Yang, H. C., Wu, Y. D. & Liu, C-H., 2012 Dec 1, ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging. p. 101-104 4 p. 6474579. (ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron detrapping in thin hafnium silicate and nitrided hafnium silicate gate dielectric stacks

Huang, H. S., Samanta, P., Tzeng, T. J., Chen, S. Y. & Liu, C. H., 2012 Jan 9, In : Applied Physics Letters. 100, 2, 023501.

Research output: Contribution to journalArticle

5 Citations (Scopus)

Leakage current conduction behaviors of 0.65 nm equivalent-oxide-thickness HfZrLaO gate dielectrics

Lin, K. C., Chen, J. Y., Hsu, H. W., Chen, H. W. & Liu, C-H., 2012 Nov 1, In : Solid-State Electronics. 77, p. 7-11 5 p.

Research output: Contribution to journalArticle

11 Citations (Scopus)

ONO側壁與CESL對MOSFET通道應力影響之分析

楊煌偉(Huang-Wei Y, 鄧榮皓(Rong-Hou D, 蔡旻琦(Ming-Chi T, 屠名正(Ming-Jenq T & 劉傳璽(Chuan-Hsi L, 2012, In : 真空科技. 25, 3, p. 22-27 6 p.

Research output: Contribution to journalArticle

Reliability characteristics of metal-oxide-semiconductor capacitors with 0.72 nm equivalent-oxide-thickness LaO/HfO2 stacked gate dielectrics

Liu, C-H., Hsu, H. W., Chen, H. W., Juan, P. C., Wang, M. C., Cheng, C-P. & Huang, H. S., 2012 Jan 1, In : Microelectronic Engineering. 89, 1, p. 15-18 4 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)

The effect of lanthanum (La) incorporation in ultra-thin ZrO2 high-κ gate dielectrics

Liu, C. H., Juan, P. C., Chou, Y. H. & Hsu, H. W., 2012 Jan 1, In : Microelectronic Engineering. 89, 1, p. 2-5 4 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)

Time dependent dielectric breakdown (TDDB) characteristics of metal-oxide-semiconductor capacitors with HfLaO and HfZrLaO ultra-thin gate dielectrics

Hsu, H. W., Huang, H. S., Chen, H. W., Cheng, C-P., Lin, K. C., Chen, S. Y., Wang, M. C. & Liu, C-H., 2012 Nov 1, In : Solid-State Electronics. 77, p. 2-6 5 p.

Research output: Contribution to journalArticle

3 Citations (Scopus)
2011

Adaptive fuzzy control of two-wheeled balancing vehicle

Chen, J. Y., Liu, C. H., Chen, C. C. & Lin, K. C., 2011 Dec 1, Proceedings - 2011 International Conference on Instrumentation, Measurement, Computer, Communication and Control, IMCCC 2011. p. 341-344 4 p. 6154070. (Proceedings - 2011 International Conference on Instrumentation, Measurement, Computer, Communication and Control, IMCCC 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Current conduction mechanisms of 0.65 nm equivalent oxide thickness HfZrLaO thin films

Chen, H. W., Hsu, H. W., Chen, S. Y., Huang, H. S., Wang, M. C. & Liu, C. H., 2011 Sep 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991686. (Proceedings - International NanoElectronics Conference, INEC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Degradation mechanism for continuous-wave green laser-crystallized polycrystalline silicon n-channel thin-film transistors under low vertical-field hot-carrier stress with different laser annealing powers

Wang, M. C., Yang, H. C., Hsu, H. W., Hsieh, Z. Y., Chen, S. Y., Chang, S. Y. & Liu, C. H., 2011 Apr 1, In : Japanese Journal of Applied Physics. 50, 4 PART 2, 04DH16.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Influence of la substitution on the electrical properties of metal-ferroelectric (BiFeO3)-insulator (CeO2)- semiconductor nonvolatile memory structures

Juan, P. C., Hsu, C. W., Liu, C. H., Wang, M. T. & Yeh, L. Y., 2011 Jul 1, In : Microelectronic Engineering. 88, 7, p. 1217-1220 4 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)

Motion estimation using two-stage predictive search algorithms based on joint spatio-temporal correlation information

Hsieh, L., Chen, W. S. & Liu, C. H., 2011 Sep, In : Expert Systems with Applications. 38, 9, p. 11608-11623 16 p.

Research output: Contribution to journalArticle

13 Citations (Scopus)

SOP package surface discoloration after PCT test

Wang, M. C., Yang, H. C., Liu, C-H. & Yang, R. H., 2011 Nov 22, ICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging. p. 855-858 4 p. 6066964

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

The influence of physical and electrical properties in HfO2 thin film with different lanthanum doping position

Juan, P. C., Chien, Y. S., Lin, J. Y., Cheng, C. P., Liu, C. H., Hsu, H. W., Chen, H. W. & Huang, H. S., 2011 Sep 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991692. (Proceedings - International NanoElectronics Conference, INEC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The study of integrating PDA mobile learning device into the Arts and Humanities Learning Curriculum for elementary schools-mobile digital learning space

Chao, J., Lu, Y. H., Tzeng, Y. D. & Liu, C. H., 2011 Sep 23, 2011 International Conference on Multimedia Technology, ICMT 2011. p. 6119-6124 6 p. 6001904

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Time dependent dielectric breakdown (TDDB) characteristics of metal-oxide-semiconductor capacitors with HfLaO and HfZrLaO ultra-thin gate dielectrics

Liu, C-H., Chen, Y. L., Cheng, C-P., Chen, H. W., Hsu, H. W., Chen, S. Y., Huang, H. S. & Wang, M. C., 2011 Sep 26, 4th IEEE International NanoElectronics Conference, INEC 2011. 5991693. (Proceedings - International NanoElectronics Conference, INEC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2010

A genome-wide quantitative trait loci scan of neurocognitive performances in families with schizophrenia

Lien, Y. J., Liu, C. M., Faraone, S. V., Tsuang, M. T., Hwu, H. G., Hsiao, P. C. & Chen, W. J., 2010 Oct 1, In : Genes, Brain and Behavior. 9, 7, p. 695-702 8 p.

Research output: Contribution to journalArticle

17 Citations (Scopus)

Ameliorated particle swarm optimization by integrating Taguchi methods

Liu, C-H., Chen, Y. L. & Chen, J. Y., 2010 Nov 15, 2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010. p. 1823-1828 6 p. 5580960. (2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010; vol. 4).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

An adaptive PID controller

Chen, J. Y., Liu, C. H., Fan, C. W., Shin, H. Y. & Yen, M. H., 2010 Nov 15, 2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010. p. 884-889 6 p. 5580596. (2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010; vol. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

A study to performance of electroplating solder bump in assembly

Wang, M. C., Huang, K. S., Hsieh, Z. Y., Yang, H. C., Liu, C-H. & Lin, C. R., 2010 Nov 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 794-797 4 p. 5582692. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Depth profiles and chemical bonding states of graded doping and ultra-thin HfLaO high-k dielectrics deposited on silicon substrate

Juan, P. C., Liu, C-H., Jou, M., Chen, Y. K., Liu, Y. W., Hsu, C. W., Chou, Y. H. & Lin, J. Y., 2010 May 5, INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. p. 672-673 2 p. 5424647. (INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Efficiency improvement of organic light emitting diodes with co-deposited hole blocking layer

Liu, C. H., Tseng, C. H. & Cheng, C. P., 2010 Jan 1, Diffusion in Solids and Liquids V. Trans Tech Publications Ltd, Vol. 297-301. p. 561-566 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Efficiency of dispenser with nozzle technology in assembly

Wang, M. C., Huang, K. S., Chen, S. Y., Hsieh, Z. Y., Yang, H. C., Liu, C-H. & Lin, C. R., 2010 Nov 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 476-479 4 p. 5583781. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrical characteristics and reliability properties of metal-oxide-semiconductor capacitors with HfZrLaO gate dielectrics

Liu, C. H. & Chen, H. W., 2010 May 1, In : Microelectronics Reliability. 50, 5, p. 599-602 4 p.

Research output: Contribution to journalArticle

7 Citations (Scopus)

Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics

Chen, H. W. & Liu, C-H., 2010 May 1, In : Microelectronics Reliability. 50, 5, p. 614-617 4 p.

Research output: Contribution to journalArticle

7 Citations (Scopus)

Influences of dye doping and hole blocking layer insertion on OLED performance

Tesng, C. H., Liu, C. H. & Cheng, C. P., 2010 Jan 1, Diffusion in Solids and Liquids V. Trans Tech Publications Ltd, Vol. 297-301. p. 555-560 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Performance of silver-glue attachment technology in assembly

Wang, M. C., Huang, K. S., Hsieh, Z. Y., Yang, H. C., Liu, C. H. & Lin, C. R., 2010 Nov 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 472-475 4 p. 5583797. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process

Wang, M. C., Liu, C-H., Huang, K. S., Hsieh, Z. Y., Chen, S. Y., Yang, H. C. & Lin, C. R., 2010 Jun 1, In : Microelectronics Reliability. 50, 6, p. 839-846 8 p.

Research output: Contribution to journalArticle

Structural properties of ultra-thin Y2O3 gate dielectrics studied by X-Ray Diffraction (XRD) and X-Ray Photoelectron Spectroscopy (XPS)

Liu, C. H., Juan, P. C., Cheng, C. P., Lai, G. T., Lee, H., Chen, Y. K., Liu, Y. W. & Hsu, C. W., 2010 May 5, INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. p. 1256-1257 2 p. 5424914. (INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Substrate current verifying lateral electrical field under forward substrate biases for nMOSFETs

Huang, H. S., Wang, M. C., Hsieh, Z. Y., Chen, S. Y., Chuang, A. E. & Liu, C-H., 2010 May 1, In : Solid-State Electronics. 54, 5, p. 527-529 3 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

The influence of lanthanum doping position in ultra-thin HfO2 films for high-k gate dielectrics

Liu, C-H., Juan, P. C. & Lin, J. Y., 2010 Oct 1, In : Thin Solid Films. 518, 24, p. 7455-7459 5 p.

Research output: Contribution to journalArticle

16 Citations (Scopus)
9 Citations (Scopus)
2009

Analysis of promising copper wire bonding in assembly consideration

Wang, M. C., Hsieh, Z. Y., Huang, K. S., Liu, C. H. & Lin, C. R., 2009, IMPACT Conference 2009 International 3D IC Conference - Proceedings. p. 108-111 4 p. 5382168

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Current conduction of 0.72 nm equivalent-oxide-thickness LaO/HfO 2 stacked gate dielectrics

Liu, C. H., Chen, H. W., Chen, S. Y., Huang, H. S. & Cheng, L. W., 2009 Jul 20, In : Applied Physics Letters. 95, 1, 012103.

Research output: Contribution to journalArticle

34 Citations (Scopus)

Electrical characterization and dielectric properties of metal-oxide-semiconductor structures using high-K CeZrO4 ternary oxide as gate dielectric

Juan, P. C., Liu, C-H., Lin, C. L., Ju, S. C., Chen, M. G., Chanf, I. Y. K. & Lu, J. H., 2009 May 1, In : Japanese Journal of Applied Physics. 48, 5 PART 2

Research output: Contribution to journalArticle

11 Citations (Scopus)

National project on 45 to 32 nm metal oxide semiconductor field effect transistors for next century IC fabrications

Hwang, H. L., Wang, C. W., Chang, K. H., Tsai, C. H., Leou, K. C., Chang-Liao, K. S., Lu, C. C., Chang, S. C., Liu, C. H., Chin, A., Chang, K. M. & Chen, B. N., 2009 Apr 4, In : e-Journal of Surface Science and Nanotechnology. 7, p. 507-512 6 p.

Research output: Contribution to journalArticle

Optimization of solderability for 2.4GHz RF printed-circuit-board products

Wang, M. C., Yang, T. Y., Hsieh, Z. Y., Yang, H. C., Liu, C. H. & Lin, C. R., 2009 Dec 1, IMPACT Conference 2009 International 3D IC Conference - Proceedings. p. 227-230 4 p. 5382133

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The influence of Hf-composition on atomic layer deposition HfSiON gated metal-oxide-semiconductor field-effect transistors after channel-hot-carrier stress

Chen, S. Y., Chen, H. W., Liu, C. H. & Cheng, L. W., 2009 Apr 1, In : Japanese Journal of Applied Physics. 48, 4 PART 2, 04C009.

Research output: Contribution to journalArticle

5 Citations (Scopus)
2008

Electrical and reliability characteristics in strained-Si mOSFETs

Yang, C. C., Pan, T. M., Chen, K. M. & Liu, C. H., 2008 Nov 17, ECS Transactions - Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing. 2 ed. p. 271-277 7 p. (ECS Transactions; vol. 13, no. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution