• 633 Citations
  • 14 h-Index
19972019

Research output per year

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Research Output

1997

Breakdown model and lifetime projection for thin gate oxide MOS devices

Liu, C-H., Grondin, R. O., DeMassa, T. A. & Sanchez, J. J., 1997 Dec 1, In : Biennial University/Government/Industry Microelectronics Symposium - Proceedings. p. 78-82 5 p.

Research output: Contribution to journalConference article

1998

New mechanism for gate oxide degradation and its applications

Liu, C. H., Fu, K. Y., DeMassa, T. A. & Sanchez, J. J., 1998, International Integrated Reliability Workshop Final Report. IEEE, p. 68-71 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Surface plasmons and breakdown in thin silicon dioxide films on silicon

Kim, J. H., Sanchez, J. J., DeMassa, T. A., Quddus, M. T., Smith, D., Shaapur, F., Weiss, K. & Liu, C-H., 1998 Aug 1, In : Journal of Applied Physics. 84, 3, p. 1430-1438 9 p.

Research output: Contribution to journalArticle

16 Citations (Scopus)
1999

Analysis of hot-carrier degradation in 0.25-μm surface-channel pMOSFET devices

Liu, C. H., Chen, M. G., Huang-Lu, S., Chang, Y. J. & Fu, K. Y., 1999 Jan 1, In : International Symposium on VLSI Technology, Systems, and Applications, Proceedings. p. 82-85 4 p.

Research output: Contribution to journalConference article

4 Citations (Scopus)

Modeling and correlation of gate oxide QBD between exponential current ramp and constant current stresses

Liu, C-H., Cheng, T. J., Wang, M. C., Yang, S. H. & Fu, K. Y., 1999 Jan 1, In : International Symposium on VLSI Technology, Systems, and Applications, Proceedings. p. 94-95 2 p.

Research output: Contribution to journalConference article

1 Citation (Scopus)

New experimental findings on SILC and SBD of ultra-thin gate oxides

Chen, M. G., Liu, C-H., Lee, M. T. & Fu, K. Y., 1999 Dec 1, p. 114-117. 4 p.

Research output: Contribution to conferencePaper

Temperature dependence of surface plasmon and breakdown for thin and thick silicon-dioxide

Kim, J. H., Sanchez, J. J., DeMassa, T. A., Quddus, M. T., Grondin, R. O. & Liu, C. H., 1999 Jan 1, In : Solid-State Electronics. 43, 1, p. 57-63 7 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)
2000

Comparison and correlation of ESD HBM (Human Body Model) obtained between TLPG, wafer-level, and package-level tests

Lee, M. T., Liu, C. H., Lin, C. C., Chou, J. T., Tang, H. T. H., Chang, Y. J. & Fu, K. Y., 2000 Dec 1, In : Electrical Overstress/Electrostatic Discharge Symposium Proceedings. p. 105-110 6 p.

Research output: Contribution to journalConference article

2 Citations (Scopus)

Forward gated-diode measurement of filled traps in high-field stressed thin oxides

Chen, M. J., Kang, T. K., Huang, H. T., Liu, C. H., Chang, Y. J. & Fu, K. Y., 2000 Aug 1, In : IEEE Transactions on Electron Devices. 47, 8, p. 1682-1683 2 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)

Negative bias temperature instability (NBTI) in deep sub-micron p+-gate pMOSFETs

Chen, Y. F., Lin, M. H., Chou, C. H., Chang, W. C., Huang, S. C., Chang, Y. J., Fu, K. Y., Lee, M. T., Liu, C-H. & Fan, S. K., 2000 Dec 1, p. 98-101. 4 p.

Research output: Contribution to conferencePaper

20 Citations (Scopus)

Oxide thinning percolation statistical model for soft breakdown in ultrathin gate oxides

Chen, M. J., Kang, T. K., Liu, C. H., Chang, Y. J. & Fu, K. Y., 2000 Jul 24, In : Applied Physics Letters. 77, 4, p. 555-557 3 p.

Research output: Contribution to journalArticle

23 Citations (Scopus)
2001

High performance 50 nm CMOS devices for microprocessor and embedded processor core applications

Huang, S. F., Lin, C. Y., Huang, Y. S., Schafbauer, T., Eller, M., Cheng, Y. C., Cheng, S. M., Sportouch, S., Jin, W., Rovedo, N., Grassmann, A., Huang, Y., Brighten, J., Liu, C. H., Von Ehrenwall, B., Chen, N., Chen, J., Park, O. S., Commons, M., Thomas, A. & 8 others, Lee, M. T., Rauch, S., Clevenger, L., Kaltalioglu, E., Leung, P., Chen, J., Schiml, T. & Wann, C., 2001 Jan 1, In : Technical Digest-International Electron Devices Meeting. p. 237-240 4 p.

Research output: Contribution to journalArticle

39 Citations (Scopus)

Low-frequency noise in n-channel metal-oxide-semiconductor field-effect transistors undergoing soft breakdown

Chen, M. J., Kang, T. K., Lee, Y. H., Liu, C. H., Chang, Y. J. & Fu, K. Y., 2001 Jan 1, In : Journal of Applied Physics. 89, 1, p. 648-653 6 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)

Mechanism and process dependence of negative bias temperature instability (NBTI) for pMOSFETs with ultrathin gate dielectrics

Liu, C. H., Lee, M. T., Lin, C. Y., Chen, J., Schruefer, K., Brighten, J., Rovedo, N., Hook, T. B., Khare, M. V., Huang, S. F., Wann, C., Chen, T. C. & Ning, T. H., 2001 Jan 1, In : Technical Digest-International Electron Devices Meeting. p. 861-864 4 p.

Research output: Contribution to journalArticle

44 Citations (Scopus)

Numerical confirmation of inelastic trap-assisted tunneling (ITAT) as SILC mechanism

Kang, T. K., Chen, M. J., Liu, C. H., Chang, Y. J. & Fan, S. K., 2001 Oct 1, In : IEEE Transactions on Electron Devices. 48, 10, p. 2317-2322 6 p.

Research output: Contribution to journalArticle

11 Citations (Scopus)
2002

Comparison of electrical and reliability characteristics of different 14 Å oxynitride gate dielectrics

Pan, T. M., Lin, H. S., Chen, M. G., Liu, C. H. & Chang, Y. J., 2002 Jul, In : IEEE Electron Device Letters. 23, 7, p. 416-418 3 p.

Research output: Contribution to journalArticle

7 Citations (Scopus)

ESD protection for the tolerant I/O circuits using PESD implantation

Tang, H. T. H., Chen, S. S., Liu, S., Lee, M. T., Liu, C. H., Wang, M. C. & Jeng, M. C., 2002 Mar 1, In : Journal of Electrostatics. 54, 3-4, p. 293-300 8 p.

Research output: Contribution to journalArticle

16 Citations (Scopus)

Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N2O-grown oxides and NO RTA treatment

Liu, C. H., Lin, H. S., Lin, Y. Y., Chen, M. G., Pan, T. M., Kao, C. J., Huang, K. T., Lin, S. H., Sheng, Y. C., Chang, W. T., Lee, J. H., Huang, M., Hsiung, C. S., Huang-Lu, S., Hsu, C. C., Liang, A. Y., Chen, J., Hsieh, W. Y., Yen, P. W., Chien, S. C. & 3 others, Loh, Y. T., Chang, Y. J. & Liou, F. T., 2002 Jan 1, 2002 IEEE International Reliability Physics Symposium Proceedings, IRPS 2002 - 40th Annual. Institute of Electrical and Electronics Engineers Inc., p. 268-271 4 p. 996646. (IEEE International Reliability Physics Symposium Proceedings; vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N2O-grown oxides and NO RTA treatment

Liu, C. H., Lin, H. S., Lin, Y. Y., Chen, M. G., Pan, T. M., Kao, C. J., Huang, K. T., Lin, S. H., Sheng, Y. C., Chang, W. T., Lee, J. H., Huang, M., Hsiung, C. S., Huang-Lu, S., Hsu, C. C., Liang, A. Y., Chen, J., Hsieh, W. Y., Yen, P. W., Chien, S. C. & 3 others, Loh, Y. T., Chang, Y. J. & Liou, F. T., 2002 Jan 1, In : Annual Proceedings - Reliability Physics (Symposium). p. 268-271 4 p.

Research output: Contribution to journalConference article

2 Citations (Scopus)

Mechanism of threshold voltage shift (Δ Vth) caused by negative bias temperature instability (NBTI) in deep submicron pMOSFETs

Liu, C. H., Lee, M. T., Lin, C. Y., Chen, J., Loh, Y. T., Liou, F. T., Schruefer, K., Katsetos, A. A., Yang, Z., Rovedo, N., Hook, T. B., Wann, C. & Chen, T. C., 2002 Apr, In : Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 41, 4 B, p. 2423-2425 3 p.

Research output: Contribution to journalArticle

51 Citations (Scopus)
2003

NBTI mechanism explored on the back gate bias for pMOSFETs

Chen, M. G., Li, J. S., Jiang, C., Liu, C. H., Su, K. C. & Chang, Y. H., 2003 Jan 1, 2003 IEEE International Integrated Reliability Workshop Final Report, IRW 2003. Institute of Electrical and Electronics Engineers Inc., p. 131-132 2 p. 1283319. (IEEE International Integrated Reliability Workshop Final Report; vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)
2005
4 Citations (Scopus)
1 Citation (Scopus)
2006

Magnetic relaxation measurement in immunoassay using high-transition- temperature superconducting quantum interference device system

Yang, H-C., Yang, S-Y., Fang, G. L., Huang, W. H., Liu, C-H., Liao, S-H., Horng, H-E. & Hong, C. Y., 2006 Jul 11, In : Journal of Applied Physics. 99, 12, 124701.

Research output: Contribution to journalArticle

27 Citations (Scopus)

On the design and analysis of the 4th-order leapfrog sigma-delta modulator

Lin, K. C. & Liu, C. H., 2006, 2006 International Conference on Communications, Circuits and Systems, ICCCAS, Proceedings - Circuits and Systems. Vol. 4. p. 2304-2308 5 p. 4064385

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2007

Electrical characterization of ZrO2/Si interface properties in MOSFETs with ZrO2 gate dielectrics

Liu, C. H. & Chiu, F. C., 2007 Jan 1, In : IEEE Electron Device Letters. 28, 1, p. 62-64 3 p.

Research output: Contribution to journalArticle

12 Citations (Scopus)

Hot carrier and negative-bias temperature instability reliabilities of strained-Si MOSFETs

Liu, C. H. & Pan, T. M., 2007 Jul 1, In : IEEE Transactions on Electron Devices. 54, 7, p. 1799-1803 5 p.

Research output: Contribution to journalArticle

12 Citations (Scopus)

On the reverse short-channel effect and threshold voltage roll-off controls for 90 nm node MOSFETs

Chen, S. Y., Tu, C. H., Lin, J. C., Chen, Y. T., Zhuang, S. J., Huang, H. S., Liu, C. H., Chou, S. & Ko, J., 2007 Jan 1, In : Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an. 30, 5, p. 847-853 7 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Physical and electrical properties of Ti-doped Er2 O3 films for high-k gate dielectrics

Liu, C. H., Pan, T. M., Shu, W. H. & Huang, K. C., 2007 Jun 20, In : Electrochemical and Solid-State Letters. 10, 8, p. G54-G57

Research output: Contribution to journalArticle

10 Citations (Scopus)
2008

Electrical and reliability characteristics in strained-Si mOSFETs

Yang, C. C., Pan, T. M., Chen, K. M. & Liu, C. H., 2008 Nov 17, ECS Transactions - Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing. 2 ed. p. 271-277 7 p. (ECS Transactions; vol. 13, no. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrical characterization and carrier transportation in Hf-silicate dielectrics using ALD gate stacks for 90 nm node MOSFETs

Chen, H. W., Chen, S. Y., Chen, K. C., Huang, H. S., Liu, C. H., Chiu, F. C., Liu, K. W., Lin, K. C., Cheng, L. W., Lin, C. T., Ma, G. H. & Sun, S. W., 2008 Jul 30, In : Applied Surface Science. 254, 19, p. 6127-6130 4 p.

Research output: Contribution to journalArticle

14 Citations (Scopus)

Hot carrier reliability of ald HfSiON gated MOSFETs with different compositions

Chen, H. W., Chen, S. Y., Lu, C. C., Liu, C. H., Chiu, F. C., Hsieh, Z. Y., Huang, H. S., Cheng, L. W., Lin, C. T., Ma, G. H. & Sun, S. W., 2008 Dec 1, ECS Transactions - Physics and Technology of High-k Gate Dielectrics 6. 5 ed. p. 55-66 12 p. (ECS Transactions; vol. 16, no. 5).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Interface characterization and current conduction in HfO 2 -gated MOS capacitors

Chen, H. W., Chiu, F. C., Liu, C. H., Chen, S. Y., Huang, H. S., Juan, P. C. & Hwang, H. L., 2008 Jul 30, In : Applied Surface Science. 254, 19, p. 6112-6115 4 p.

Research output: Contribution to journalArticle

30 Citations (Scopus)

Interfacial and electrical characterization of hfo2-gated MOSCs and MOSFETs by C-V and gated-diode method

Chen, S. Y., Chen, H. W., Chen, C. H., Chiu, F. C., Liu, C. H., Hsieh, Z. Y., Huang, H. S. & Hwang, H. L., 2008 Dec 1, ECS Transactions - Physics and Technology of High-k Gate Dielectrics 6. 5 ed. p. 131-138 8 p. (ECS Transactions; vol. 16, no. 5).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Interfacial characterization of ceo2-gatcd MOSFETs using gated-diode method and charge pumping technique

Chm, F. C., Chen, H. W., Chen, C. H., Liu, C. H., Chen, S. Y., Huang, B. S., Hsieh, Z. Y., Huang, H. S. & Hwang, H. L., 2008 Dec 1, ECS Transactions - Physics and Technology of High-k Gate Dielectrics 6. 5 ed. p. 423-432 10 p. (ECS Transactions; vol. 16, no. 5).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

National Project on 45 to 32 nm metal oxide semiconductor field effect transistors for next century IC fabrications

Hwang, H. L., Wang, C. W., Chang, K. H., Tsai, C. H., Leou, K. C., Chang-Liao, K. S., Lu, C. C., Chang, S. C., Chiu, F. C., Liu, C. H., Chin, A., Chang, K. M. & Chen, B. N., 2008 Dec 1, 2008 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC. 4760691. (2008 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Robots with object-oriented peripheral modules controlled by a Personal Single Board Computer (PSBC)

Liu, C-H., Hsu, H. W., Chen, J. Y., Chao, J., Pao, H. & Chang, J., 2008 Dec 1, IEEE International Conference on Advanced Robotics and its Social Impacts, ARSO 2008. 4653614. (Proceedings of IEEE Workshop on Advanced Robotics and its Social Impacts, ARSO).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2009

Analysis of promising copper wire bonding in assembly consideration

Wang, M. C., Hsieh, Z. Y., Huang, K. S., Liu, C. H. & Lin, C. R., 2009, IMPACT Conference 2009 International 3D IC Conference - Proceedings. p. 108-111 4 p. 5382168

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Current conduction of 0.72 nm equivalent-oxide-thickness LaO/HfO 2 stacked gate dielectrics

Liu, C. H., Chen, H. W., Chen, S. Y., Huang, H. S. & Cheng, L. W., 2009 Jul 20, In : Applied Physics Letters. 95, 1, 012103.

Research output: Contribution to journalArticle

34 Citations (Scopus)

Electrical characterization and dielectric properties of metal-oxide-semiconductor structures using high-K CeZrO4 ternary oxide as gate dielectric

Juan, P. C., Liu, C-H., Lin, C. L., Ju, S. C., Chen, M. G., Chanf, I. Y. K. & Lu, J. H., 2009 May 1, In : Japanese Journal of Applied Physics. 48, 5 PART 2

Research output: Contribution to journalArticle

11 Citations (Scopus)

National project on 45 to 32 nm metal oxide semiconductor field effect transistors for next century IC fabrications

Hwang, H. L., Wang, C. W., Chang, K. H., Tsai, C. H., Leou, K. C., Chang-Liao, K. S., Lu, C. C., Chang, S. C., Liu, C. H., Chin, A., Chang, K. M. & Chen, B. N., 2009 Apr 4, In : e-Journal of Surface Science and Nanotechnology. 7, p. 507-512 6 p.

Research output: Contribution to journalArticle

Optimization of solderability for 2.4GHz RF printed-circuit-board products

Wang, M. C., Yang, T. Y., Hsieh, Z. Y., Yang, H. C., Liu, C. H. & Lin, C. R., 2009 Dec 1, IMPACT Conference 2009 International 3D IC Conference - Proceedings. p. 227-230 4 p. 5382133

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The influence of Hf-composition on atomic layer deposition HfSiON gated metal-oxide-semiconductor field-effect transistors after channel-hot-carrier stress

Chen, S. Y., Chen, H. W., Liu, C. H. & Cheng, L. W., 2009 Apr 1, In : Japanese Journal of Applied Physics. 48, 4 PART 2, 04C009.

Research output: Contribution to journalArticle

5 Citations (Scopus)
2010

A genome-wide quantitative trait loci scan of neurocognitive performances in families with schizophrenia

Lien, Y. J., Liu, C. M., Faraone, S. V., Tsuang, M. T., Hwu, H. G., Hsiao, P. C. & Chen, W. J., 2010 Oct 1, In : Genes, Brain and Behavior. 9, 7, p. 695-702 8 p.

Research output: Contribution to journalArticle

17 Citations (Scopus)

Ameliorated particle swarm optimization by integrating Taguchi methods

Liu, C-H., Chen, Y. L. & Chen, J. Y., 2010 Nov 15, 2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010. p. 1823-1828 6 p. 5580960. (2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010; vol. 4).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

An adaptive PID controller

Chen, J. Y., Liu, C. H., Fan, C. W., Shin, H. Y. & Yen, M. H., 2010 Nov 15, 2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010. p. 884-889 6 p. 5580596. (2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010; vol. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

A study to performance of electroplating solder bump in assembly

Wang, M. C., Huang, K. S., Hsieh, Z. Y., Yang, H. C., Liu, C-H. & Lin, C. R., 2010 Nov 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 794-797 4 p. 5582692. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Depth profiles and chemical bonding states of graded doping and ultra-thin HfLaO high-k dielectrics deposited on silicon substrate

Juan, P. C., Liu, C-H., Jou, M., Chen, Y. K., Liu, Y. W., Hsu, C. W., Chou, Y. H. & Lin, J. Y., 2010 May 5, INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. p. 672-673 2 p. 5424647. (INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Efficiency improvement of organic light emitting diodes with co-deposited hole blocking layer

Liu, C. H., Tseng, C. H. & Cheng, C. P., 2010 Jan 1, Diffusion in Solids and Liquids V. Trans Tech Publications Ltd, Vol. 297-301. p. 561-566 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Efficiency of dispenser with nozzle technology in assembly

Wang, M. C., Huang, K. S., Chen, S. Y., Hsieh, Z. Y., Yang, H. C., Liu, C-H. & Lin, C. R., 2010 Nov 24, Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010. p. 476-479 4 p. 5583781. (Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution