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Fingerprint Dive into the research topics where Chuan-Hsi Liu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 4 Similar Profiles
Gate dielectrics Engineering & Materials Science
MOSFET devices Engineering & Materials Science
metal oxide semiconductors Physics & Astronomy
Oxides Engineering & Materials Science
Hot carriers Engineering & Materials Science
field effect transistors Physics & Astronomy
Leakage currents Engineering & Materials Science
Capacitors Engineering & Materials Science

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Research Output 1997 2018

Open Access
Concept Learning

Editorial: IEDMS 2016

Liu, C. H., Cheng, C. H., Cheng, C. P. & Liou, J. J., 2018 Apr, In : Microelectronics Reliability. 83, 1 p.

Research output: Contribution to journalEditorial

Effect of contact-etch-stop-layer and Si1-xGex channel mechanical properties on nano-scaled short channel NMOSFETs with dummy gate arrays

Lee, C. C., Liu, C. H., Li, D. Y. & Hsieh, C. P., 2018 Apr 1, In : Microelectronics Reliability. 83, p. 230-234 5 p.

Research output: Contribution to journalArticle

mechanical properties
Mechanical properties

Wide Bandgap Materials for Semiconductor Devices

Lee, K. W., Liu, C. H. & Misra, D., 2018 Dec 1, In : Microelectronics Reliability. 91, 1 p.

Research output: Contribution to journalEditorial

Semiconductor devices
semiconductor devices
Energy gap
2 Citations (Scopus)

A 14-nm FinFET Logic CMOS Process Compatible RRAM Flash with Excellent Immunity to Sneak Path

Hsieh, E. R., Kuo, Y. C., Cheng, C. H., Kuo, J. L., Jiang, M. R., Lin, J. L., Chen, H. W., Chung, S. S., Liu, C. H., Chen, T. P., Huang, S. A., Chen, T. J. & Cheng, O., 2017 Dec 1, In : IEEE Transactions on Electron Devices. 64, 12, p. 4910-4918 9 p., 8089812.

Research output: Contribution to journalArticle

Data storage equipment
Oxygen vacancies